Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences SEM Hitachi Single Mount Storage Tube
A plastic tube and plug for M4 threaded Hitachi mounts. 15 mm in diameter Tube. A 15 mm Hitachi mount can be inserted securely to the plug and then protected by the tube. Ideal for storage as well as mailing. The internal diameter of the tube is 0.83"(21 mm). The Outer measurements of the tube are: 0.9" (23 mm) x2.05” H (52 mm)
Electron Microscopy Sciences High Resolution Magnification Calibration 150-2DUTC Choose the mount
Model 150-2D is a very high resolution reference and traceable standards for magnification calibration of AFM, SEM, Auger, and FIB. It has a precision, holographic pattern that provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.
The period is 144 nm pitch, two-dimensional array that is accurate to +/- 1 nm (calibration certificate will have actual pitch.) Surface: Aluminum bumps on Silicon, 4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.
For SEM an independent analytical lab has tested this specimen in a FE-SEM and found that the pattern was very uniform and the specimen was easy to image. No significant charging was observed in the voltage range 1-20 kV. This traceable, Certified Standard is a select grade.
Electron Microscopy Sciences Indexed Grid Reticle RET 83, 19 mm, 5 mm x 5 mm Scale, 1 mm squares Divisions
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 19 mm
Scale: 5 mm x 5 mm
Divisions: 1 mm squares
Line width: 10 µm
Electron Microscopy Sciences Crossed Scale Microscope Graticle NE 72, 24 mm, 20 mm with 200 divisions of 0.1 mm
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. Crossed micrometer scale.
Size: 24 mm
Divisions: 20 mm with 200 divisions of 0.1 mm
Electron Microscopy Sciences Grid Reticle RET 73, 19 mm, 10 mm x 10 mm Scale, 1 mm squares Divisions
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 19 mm
Scale: 10 mm x 10 mm
Divisions: 1 mm squares
Line width: 25 µm
Electron Microscopy Sciences Indexed Grid Graticle NE71, 26 mm, 20 x 20 Grid of 0.5 mm squares
Useful for particle counting, particularly when reference is needed between workers. Also, they are useful for area of specimen determinations. Index Pattern.
Size: 26 mm
Divisions: 20 x 20 Grid of 0.5 mm squares
Electron Microscopy Sciences Mechanical Tool Kit
The mechanical sample preparation prior to thinning requires custom made mechanical hand tools. Containing six handy, reliable pieces, this kit has been designed on the basis of practical experience of many users. Some of the tools are suitable for adjusting the sample pieces into the Ti discs, others for removing the excess glue and cutting, or adjusting the seat plate of the sample holder.
Electron Microscopy Sciences Microscope Graticule NE31 Horizontal, 16 mm, 0.5" with 100 divisions of 0.0005"
These scales are used for the measuring of lengths of specimen or distances between points on a variety of different shaped objects. By dividing the division of the chosen graticule by the magnification of the objective one obtains an approximate value that each division will represent on the stage. Horizontal micrometer scale.
Size: 16 mm
Electron Microscopy Sciences SEM Hitachi Single Mount Storage Tube
A plastic tube and plug for M4 threaded Hitachi mounts. 15 mm in diameter Tube. A 15 mm Hitachi mount can be inserted securely to the plug and then protected by the tube. Ideal for storage as well as mailing. The internal diameter of the tube is 0.83"(21 mm). The Outer measurements of the tube are: 0.9" (23 mm) x2.05” H (52 mm)
Electron Microscopy Sciences Indexed Grid Reticle RET 83, 21 mm, 5 mm x 5 mm Scale, 1 mm squares Divisions
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 21 mm
Scale: 5 mm x 5 mm
Divisions: 1 mm squares
Line width: 10 µm
Electron Microscopy Sciences Indexed Grid Graticle NE71, 24 mm, 20 x 20 Grid of 0.5 mm squares
Useful for particle counting, particularly when reference is needed between workers. Also, they are useful for area of specimen determinations. Index Pattern.
Size: 24 mm
Divisions: 20 x 20 Grid of 0.5 mm squares
Electron Microscopy Sciences High Resolution Magnification Calibration 150-2D For AFM
Model 150-2D is a very high resolution reference and traceable standards for magnification calibration of AFM, SEM, Auger, and FIB. It has a precision, holographic pattern that provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.
The period is 144 nm pitch, two-dimensional array that is accurate to +/- 1 nm (calibration certificate will have actual pitch.) Surface: Aluminum bumps on Silicon, 4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.
For SEM an independent analytical lab has tested this specimen in a FE-SEM and found that the pattern was very uniform and the specimen was easy to image. No significant charging was observed in the voltage range 1-20 kV. Comes with a non-traceable, manufacturer's certificate.
Electron Microscopy Sciences Grid Reticle RET 71, 19 mm, 5 mm x 5 mm Scale, 0.5 mm squares Divisions
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 19 mm
Scale: 5 mm x 5 mm
Divisions: 0.5 mm squares
Line width: 25 µm