Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
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Filtered Search Results
Electron Microscopy Sciences Cross Lines Graticle NE8, 25 mm, Nominal line width 0.020 mm
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Used as NE50 but for measurements in two directions and for sighting and alignment. Image covers the entire field of view.
Size: 25 mm
Divisions: Nominal line width 0.020 mm
Surface: Chrome image
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Electron Microscopy Sciences Cross Lines Graticle NE8, 20.4 mm, Nominal line width 0.020 mm
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Used as NE50 but for measurements in two directions and for sighting and alignment. Image covers the entire field of view.
Size: 20.4 mm
Divisions: Nominal line width 0.020 mm
Surface: Chrome image
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Cross Lines Graticle NE8, 27 mm, Nominal line width 0.020 mm
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Small and/or specialty supplier based on Federal laws and SBA requirements.
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Used as NE50 but for measurements in two directions and for sighting and alignment. Image covers the entire field of view.
Size: 27 mm
Divisions: Nominal line width 0.020 mm
Surface: Chrome image
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Crossed Scale Microscope Graticle NE17, 23 mm, 10 mm with 0.1 mm subdivisions
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Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. Crossed micrometer scale.
Size: 23 mm
Divisions: 10 mm with 0.1 mm subdivisions
Surface: Chrome image
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences SEM Hitachi M4 Double 90°, 1" Head with 16 mm Pin, Aluminum
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Hitachi double 90 degree SEM mounts are made from lathe finished ultra-pure aluminum.
Head: 1"
Height: 16 mm
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Jh Technologies Inc IMMERSION OIL 7 4ML
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NC2025306 IMMERSION OIL 7 4ML
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DSI LLC Backpressure Regulator, variable 1300 - 4200psi, max. 80C, complete, for LC and SFC
Backpressure Regulator, variable 1300 - 4200psi, max. 80C, complete, for LC and SFC
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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World Precision Instrument Angled Electrode Holder
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- Electrode Holder for Micromanipulators
- 13 cm (5.12") long, 7.2 mm diameter
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Microscope Graticule NE1 Horizontal, 25 mm, 10 mm with 0.1 mm subdivisions
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These scales are used for the measuring of lengths of specimen or distances between points on a variety of different shaped objects. By dividing the division of the chosen graticule by the magnification of the objective one obtains an approximate value that each division will represent on the stage. Horizontal micrometer scale.
Size: 25 mm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Jh Technologies Inc OBJ. HI PLAN
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NC2828568 OBJ. HI PLAN
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Electron Microscopy Sciences AMD-MA Microscope Workstation, 120 x 75 cm, Stainless Steel Surface
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These isolation tables support most of the larger microscopes and their support equipment. The air isolation platform effectively removes most removes most vibrations. The rigid frame has levelling feet which ensure the table is in excellent contact with the floor. The damped rolling diaphragm isolators have a low natural frequency of 2Hz which effectively isolates out vibrations above 6Hz, well below the frequencies at which typical building vibrations begin to occur. Features an active 35x55cm isolation area and full width table guards.
Size: 120 x 75 cm
Surface: Stainless Steel
Type: Active Air Self Leveling
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences AMD-SM Microscope Workstation, 90 x 75 cm, Stainless Steel Surface
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Microscope workstations featuring a unique Sorbothane isolator design removing up to 98 percent of unwanted vibrations.
Size: 90 x 75 cm
Surface: Stainless Steel
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences AFM Metal Specimen Discs, 10 mm
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These are high quality metal discs with smooth edges and flat surfaces for use in Atomic force Microscopy.
Diameter: 10 mm
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Electron Microscopy Sciences Double FIB Sample and Grid Holder, Pin, 1/2"
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Holds a FIB sample mounted on two standard 1/2" (12.7 mm) pin stubs for FIB milling and lift-out procedures. Conveniently holds two FIB grids close to the sample to mount prepared TEM lamellae on the FIB grid for TEM imaging. Cost-effective holder suitable for all FIB/SEM systems which accept pin mount holders, including the FEI, ZEISS and Tescan systems. For the JEOL and Hitachi systems, use a pin mount adapter.
Overall Dimensions: 36.5 x 12.7 x 11.6 mm (1.44" x 0.5" x 0.46").
Pin: Standard 3.2 mm ( 1/8").
Material: Vacuum grade aluminum with brass screws.
Includes Philips screwdriver #0.
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences FIB Sample and Grid Holder, Pin, 1"
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Holds a FIB sample mounted on a standard 25 mm (1") pin stub for FIB milling and lift out procedures. Can also be used to hold FIB grids of the same thickness to mount the prepared lamellae on an FIB grid for TEM imaging. This cost-effective and versatile holder is suitable for all FIB/SEM systems which accept pin mount holders, including the FEI, ZEISS and Tescan systems. For the JEOL and Hitachi systems, use a pin mount adapter. Convenient brass thumbscrews make loading and unloading easy.
Overall Dimensions: 50 x 29 x 13.5 mm (2" x 1⅛" x ⅝").
Pin: Standard 3.2 mm ( 1/8").
Material: Vacuum grade aluminum with brass screws.
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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