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Electron Microscopy Sciences AFM Substrate Type P Silicon Wafer 1", 25 mm diameter, <100> Orientation
SDP

Supplier:  Electron Microscopy Sciences 7189304

Encompass_Preferred

These silicon wafers can be used for substrate studies or as substrate for AFM and SEM samples by cleaving the wafer. The wafers are polished on one side.
Diameter: 25 mm
Orientation: <100>
Thickness: 254-304 µm
Roughness: 2nm
Resistance: 1-30 ohms

Catalog No. 50-192-9882


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