Matrix Blanks and Standardization Solutions
Crescent Chemical Co Inc ANION STANDARD MIX 1 100ML
Anion Standard Mix 1, 6 Components In Water Multi Ion Chromatography Standard - Bromide, Chloride, Fluoride, Nitrate, Phosphate, Sulfate 100 ug/mL 100mL
Crescent Chemical Co Inc TRANS-PERMETHRIN SOLN 1ML
trans-Permethrin Single Component Calibration Standard in Acetonitrile CAS 61949-77-7 Size - 1mL Catalog Number - 8585EA
Perkin Elmer US LLC Scandium (Sc) Standard, 1000 µg/g, in Hydrocarbon Oil, 50 g
High quality reference materials are essential for accurate analytical measurement and quality control, ensuring sound decisions are made based on reliable data. PerkinElmer offers a full range of wear metal standards for all of your application needs.
Indofine Chemical STEVIOL, Herbal Standards, 471-80-7, 0.98, 20 mg
STEVIOL, Herbal Standards, 471-80-7, 0.98, 20 mg
Crescent Chemical Co Inc CIS-PERMETHRIN SOLN 1ML
cis-Permethrin Single Component Calibration Standard in Acetonitrile CAS 61949-76-6 Size - 1mL Catalog Number - 8583EA
Crescent Chemical Co Inc ABAMECTIN SOLN 1 ML
Abamectine 100 µg/mL in Acetonitrile Insecticide (Metabolite neat) CAS 71751-41-2 Molecular Weight - 1732.1272 Storage - RT Catalog Num - DRE-XA10001000AL pesticide
Perkin Elmer US LLC USP/ICH Elemental Impurities Standards Kit - Oral PDEs
Concentration of Element includes: Matrix Concentration Part No 5% HNO3/2% HCl ICH-Class 1 Elements + TI Oral N9304362 30 µg/mL: Hg 15 µg/mL: As 8 µg/mL: Tl 5 µg/mL: Cd, Pb 2% HNO3 ICH-Class 2A Elements Oral and Parenteral PDEs N9304363 200 µg/mL: Ni 100 µg/mL: V 50 µg/mL: Co 2% HCl 100 µg/mL: Au N9303728 15% HCl ICH-Class 2BPrecious Metal Elements (no Os) All PDEs N9304364 100 µg/mL: lr, Pd, Pt, Rh, Ru 2% HNO3 ICH-Class 2B Se and Ag Oral PDE N9304365 150 µg/mL: Ag, Se 5% HNO3/trace Tartaric Acid/ trace HF ICH-Class 3 Elements Oral PDEs N9304366 1,100 µg/mL: Cr 600 µg/mL: Sn 300 µg/mL: Cu, Mo 140 µg/mL: Ba 120 µg/mL: Sb 55 µg/mL: Li 2% HNO3 Internal Standards All PDEs N9304367 50 µg/mL: Ge 20 µg/mL: Ga 1 µg/mL: ln, Tb
Electron Microscopy Sciences MXS Calibration Standard 301CE for SEM Unmounted, 300 nm Spacing
EMS offers a series of calibration standards with one and two dimension calibrated patterns. These standards are created utilizing holographic interference of a particular laser frequency. They are typically accurate to <1% across the entire surface of the standard. These reference standards are remarkably durable under typical operating conditions. The surface contamination behavior is also very good. There are no better sub-micron reference standard available in this price range. 300 nanometers grid spacing of parallel ridges. W-coated Photoresist on Si. For SEM
Mount: Unmounted
Spacing: 300 nm
Structure: Parallel Ridges
Material: W-coated Photoresist on Si