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Combined Focused Ion Beam-Scanning Electron Microscopes
Microscope systems combining focused ion beam (FIB) and scanning electron microscope (SEM) capabilities; models with transmission electron microscope (TEM) capabilities available.
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This vernier caliper is a high-precision dimensional measuring tool designed for accurate length and distance measurements up to 72 in. Constructed from durable stainless steel, it is built for reliability in demanding industrial measurement applications.
Measuring range of 0 in. to 72 in.
Graduation of 0.001 in.
Constructed from high-quality stainless steel
Encompass Procurement Services Non-distribution item offered as a customer accommodation; additional freight charges may apply. Learn More