Microscope Lamps and Accessories
Micro Tech Optical Inc BPH5761 6V30W HALOGEN BULB
This item has a minimum qty of 2 per supplier requirements.
BPH5761 6V30W HALOGEN BULB
Electron Microscopy Sciences Grain Sizing Reticle NG61, 27 mm
For the determination of non-metallic inclusion content of steel. NG60 meets EN 10247 and NG61 Meets ISO 4976. Both are scaled for use eith 10x objective magnification Pattern
Size: 27 mm
Method: ISO 4967
Electron Microscopy Sciences Shorter Pin SEM Stub Slotted 18 mm Head with 6 mm Pin, Aluminum, 3.2 mm Pin diameter
SEM specimen mount with shorter pin and slotted head for use with all Zeiss/LEO SEM, FESEM & FIB systems. Made from ultra-pure aluminum with a standard lathe finish.
Head: 18 mm
Pin height: 6 mm
Pin diameter: 3.2 mm
Electron Microscopy Sciences Grating Replica Parallel Line
Shadowcast carbon replica of diffraction parallel line gratings with spacing of 462.9 nm, 2160 lines per millimeter onto 3.05mm grid.
Electron Microscopy Sciences Metallurgical Graticle G41, 19mm, ASTM Austenite 1:1
Standard pattern discs for metallurgical stereometric analysis of grain size in polished metal sections. ASTM grain size austenite, glass sandwich.
Size: 19mm
Method: ASTM Austenite 1:1
Surface: Glass sandwich
Electron Microscopy Sciences Metallurgical Graticle G54, 19mm, ASTM 24
Standard pattern discs for metallurgical stereometric analysis of grain size in polished metal sections. ASTM 24 point circular grid, glass sandwich.
Size: 19mm
Method: ASTM 24
Surface: Glass sandwich
Electron Microscopy Sciences Gilder Parallel Bar Grid G200PB, Nickel
Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected.
Material: Nickel
Pitch: 125 µm
Hole: 80 µm
Bar: 45 µm
Electron Microscopy Sciences Gilder Parallel Bar Grid G200P, Nickel
Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected.
Material: Nickel
Pitch: 125 µm
Hole: 80 µm
Bar: 45 µm
Electron Microscopy Sciences Gilder Parallel Bar Grid G400P, Copper
Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected.
Material: Copper
Pitch: 62 µm
Hole: 22 µm
Bar: 40 µm
Electron Microscopy Sciences Gilder Parallel Bar Grid G300PB, Nickel
Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected.
Material: Nickel
Pitch: 83 µm
Hole: 48 µm
Bar: 35 µm
Electron Microscopy Sciences SEM Single Mount Storage Tube 50/pk
A plastic tube and plug for storing SEM pin stub mounts. The pin mount 1/8" (3.1mm) in diameter is inserted securely to the plug and protected by the tube. Ideal for storage or mailing.
Electron Microscopy Sciences SEM Finder Grid SEMF1, Copper
Designed to aid in the identification and localization of SEM specimens when placed on standard SEM stubs. Four quadrant markers tapered towards center. 100 radial sectors.
Material: Copper
Diameter: 10 mm
Thickness: ~50 µm
Electron Microscopy Sciences SEM Finder Grid SEMF3, Nickel
Designed to aid in the identification and localization of SEM specimens when placed on standard SEM stubs. 25 cells identified by reference to alpha-numeric position.
Material: Nickel
Diameter: 10 mm
Thickness: ~50 µm