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Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish. Head: 1/2" Height: 3/8"
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Designed to aid in the identification and localization of SEM specimens when placed on standard SEM stubs. Larger cells identified 1-57 & subdivided into 4. 228 identifiable cells. Material: Nickel Diameter: 10 mm Thickness: ~50 µm
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Used as NE50 but for measurements in two directions and for sighting and alignment. Image covers the entire field of view. Size: 27 mm Divisions: Nominal line width 0.020 mm Surface: Chrome image
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Can be used for two-way measurement when calibrated as a micrometer. There are 10 concentric circles 2mm-20mm in diameter. Surface chrome image. Size: 21 mm
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For the determination of non-metallic inclusion content of steel. NG60 meets EN 10247 and NG61 Meets ISO 4976. Both are scaled for use eith 10x objective magnification Pattern Size: 23 mm Method: ISO 4967
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EMBRA electroformed grids combine a high open area with a rigid construction which allows for relatively easy handling. 3.05 mm diameter, 50 micron thick for oval hole grids. I.D.: 2 x 1 mm Material: Titanium
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Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected. Material: Copper Pitch: 125 µm Hole: 80 µm Bar: 45 µm
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