Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences JEOL SEM Cylinder Mount 10 mm Head, 10 mm height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with standard lathe finish.
Head: 3/8"
Height: 3/8"
Electron Microscopy Sciences Indexed Grid Reticle RET 80, 19 mm, 10 mm x 10 mm Scale, 0.5 mm squares Divisions
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 19 mm
Scale: 10 mm x 10 mm
Divisions: 0.5 mm squares
Line width: 25 µm
Electron Microscopy Sciences Omniprobe FIB Lift-Out Grid 4-Post, Copper
Custom 4-post lift-out grids for in-situ lift-out. Include multiple indexed mounting locations, two with vertical bars attachment surfaces and two with "V" shaped alignment surfaces. Sides have lower profile for easier access to outermost posts. 3 mm diameter.
Material: Copper
Electron Microscopy Sciences Omniprobe Beryllium Haft Ring Grids
Custom beryllium haft ring grids, 3 mm diameter.
Electron Microscopy Sciences Matthews Spray Droplet Graticle NE30, 21mm
For size and distribution assessments of aersol droplets. Used in conjunction with a 40X Microscope for direct measurements of droplets from 50-400 micron diameters. The actual pattern sizes are 50, 100, 200, and 400 microns. W.H.O. (Details on Request) and G.A. Matthews. Imperial College.
Size: 21 mm
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-1.2/1.3-2C, 200 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 1.2 µm holes with 1.3 µm spacing.
Mesh: 200
Material: Copper
Electron Microscopy Sciences Crossed Scale Microscope Graticle NE 72, Custom, 20 mm with 200 divisions of 0.1 mm
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. NE 72 Crossed Micrometer scale.
Size: Custom
Divisions: 20 mm with 200 divisions of 0.1 mm
Electron Microscopy Sciences Microscope Graticule NE28 Horizontal, 21 mm, 1 mm with 100 subdivisions
These scales are used for the measuring of lengths of specimen or distances between points on a variety of different shaped objects. By dividing the division of the chosen graticule by the magnification of the objective one obtains an approximate value that each division will represent on the stage. Vertical micrometer scale.
Size: 21 mm
Electron Microscopy Sciences Press-To-Seal Clear Silicone Sheet, 0.25 mm thick
Isolate specimens using press-to-seal silicone isolators with removable hydrophobic barriers. Silicone isolators allow researchers to isolate specimens using removable hydrophobic barriers. They may be used to isolate cells grown in culture dishes or separate multiple specimens affixed to microscope slides. Two Sides Adhesive.
Thickness: 0.25 mm
Electron Microscopy Sciences High Resolution Magnification Calibration Specimen 150-2DUTC for AFM
Model 150-2D is a very high resolution reference and traceable standards for magnification calibration of AFM, SEM, Auger, and FIB. It has a precision, holographic pattern that provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.
The period is 144 nm pitch, two-dimensional array that is accurate to +/- 1 nm (calibration certificate will have actual pitch.) Surface: Aluminum bumps on Silicon, 4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.
For SEM an independent analytical lab has tested this specimen in a FE-SEM and found that the pattern was very uniform and the specimen was easy to image. No significant charging was observed in the voltage range 1-20 kV. This traceable, Certified Standard is a select grade.
Electron Microscopy Sciences Crossed Gauge Lines Microscope Graticule NE 54, 16mm
Use as crossed lines, but for the measuring of distances between thelines. Greater accuracy can be obtained by locatng the specimen detail between the graticules gauge pair.
Size: 16mm
Divisions: Two vertical lines 0.2 mm apart
Electron Microscopy Sciences Indexed Grid Graticle NE71, 23 mm, 20 x 20 Grid of 0.5 mm squares
Useful for particle counting, particularly when reference is needed between workers. Also, they are useful for area of specimen determinations. Index Pattern.
Size: 23 mm
Divisions: 20 x 20 Grid of 0.5 mm squares
Electron Microscopy Sciences Scale with Cross Line Microscope Graticle NE777, 16 mm, 0.5" with divisions of 0.005"
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. Horizontal micrometer scale 0.5" long with divisions of 0.005".
Size: 16 mm
Divisions: 0.5" with divisions of 0.005"
Electron Microscopy Sciences Crossed Scale Microscope Graticle NE70 (imperial), 27 mm, 0.8' with 400 divisions of 0.002"
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. Crossed Micrometer scale (imperial).
Size: 27 mm
Divisions: 0.8' with 400 divisions of 0.002"
Surface: Chrome image
Electron Microscopy Sciences Broken Cross Line Reticle RET 50, 21 mm, 13 µm Line width
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 21 mm
Line width: 13 µm