Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
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Filtered Search Results
Electron Microscopy Sciences Chalkley Point Array Graticle NG52, 19mm
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Eyepiece graticle is used to quickly determine the relationship of components to each other using random sampling. Curtis gives an example of its application, where a researcher may want to see whether or not a certain drug affects the volume proportion of cell types in a given organ. With this graticule the proportion of points lying over the image of one type of component is statistically proportional to the area occupied by that component. The 25 points of the array are placed over the field of view at random, so that a comparison can be made between the number of points touching the one type of component, with number touching the other type of component in each viewing. A series of observations will yield an increasingly accurate ratio of the comparative incidence of each type of particle.
Size: 19 mm
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Electron Microscopy Sciences PS1 Micrometer Standard with Graticules Cert
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These stage micrometers are available with a calibration certificate that provides traceability for the precise calibration and confirmation of accuracy of optical measuring instruments, necessary under ISO provisions. The glass discs are mounted in stainless steel slides with engraved serial numbers. Each slide is supplied in a polished wooden storage case. A Certificate of Comparison from Pyser-SGI, Graticules Division compares the scale to a NPL calibrated in-house standards. A statemen is provided on the accuracy of the item with respect to these standards.
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Electron Microscopy Sciences Gilder Standard Square 300 mesh Cu/Pd Grid
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A reliable support specimen grid source. Features well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected. 3.05 mm diameter, 0.7 mil (18 um) thickness.
Grid: Copper/Palladium
Pitch: 83 µm
Hole: 58 µm
Bar: 25 µm
:
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Electron Microscopy Sciences Formvar Support Film 5-6 nm thick on Square 200 mesh Nickel Grid
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Support Film on grids has become a main product line for us since the demand for high quality coated grids has increased. To make your microscopy work easier and to save you a great deal of time we offer you a complete line. All of our coated grids are optically checked followed by batch testing in the EM. Packed in grid storage box. Standard coating is 5 to 6 nm thick.
Grid: Nickel
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CARL ZEISS MICROSCOPY LLC
NC3964527 OBJECTIVE PLAN APO S 1.5X FWD
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Electron Microscopy Sciences Omniprobe TEM Grid & Sample Holder, Stainless steel
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TEM grid holder with stations for 2 TEM grids and 2 sample stubs. Long post – standard is 1/8" (3.2 mm) diameter x 0.32" (8.1 mm) length. Comes with 2 sample stubs. Stainless Steel is very slightly magnetic.
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences S60 Howard Cell for Fruit Juices
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The Howard cell is a glass slide 76 mm x 35 mm with a central circular island and is used for counting mold fibers and spores in fruit juices, especially from tomatoes. With the K20 coverglass in place a 0.1 mm thickness of liquid is contained over the central island. The coverglass has 25 calibrated fields of 1.382 mm diameter through which to view the particles. This coverglass removes the necessity of precise adjustment of the microscope and eyepiece graticule in the original Howard method.
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Electron Microscopy Sciences Calibration Specimen 300-2D, Unmounted
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SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. 300-2D, pattern: array of posts, nominal pitch: 300 nm, material: W-coated photoresist on Si.
Mount: Unmounted
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Calibration Specimen 300-1D, Unmounted
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SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. 300-1D, pattern: parallel ridges, nominal pitch: 300 nm, material: W-coated photoresist on Si.
Mount: Unmounted
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences S9 Stage Counting Grid, 0.1mm Squares
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Transmitted light stage slide with 10 x 10 grid of 0.1mm squares.
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Electron Microscopy Sciences Mertz Graticle NGM1, 21mm
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Used to estimate the three-dimensional surface areas or the surface density of a component in a given volume, when the component does not have a random orientation. It comprises a test system with parallel curved lines used for measuring the intersection of points. Reference: W.A. Mertz. "Mikroskopic" Vol. 22 1967 pp 132-142.
Size: 21 mm
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Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-MH-2C, 200 mesh Cu
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C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis.
Mesh: 200
Material: Copper
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-MH-4C, 400 mesh Cu
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Small and/or specialty supplier based on Federal laws and SBA requirements.
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C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis.
Mesh: 400
Material: Copper
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Morrell Instrument Company Inc MORRELL INSTRUMENT COMPANY INC
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NC3892656 NIKON ECLIPSE CI-L-PLUS PKG
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Electron Microscopy Sciences Glassine Negative Envelope Plain, 6.5 x 9 cm
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Glassine envelopes, acid free for negative storage. Open end, thumb-cut, side-seamed.
Use: 6.5 x 9 cm
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