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Terra Universal Cleanroom Probe Tips
SDP

Catalog No. 19111116 Shop All Terra Universal Inc. Products
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For Use With (Equipment):
Automatic and Manual Wafer Probing Units
Catalog No. For Use With (Equipment)
19-111-116 Automatic and Manual Wafer Probing Units
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Catalog No. 19-111-116

Supplier: Terra Universal 911102

Description

Electropolished tips reduce contact resistance

Tip minimizes breakage and can be used for all automatic and manual wafer probing units.

  • Taper length: 6mm (0.23 in.)
  • Taper angle: 5°
  • Tip radius: 0.0127mm (0.0005 in.)
  • Shank diameter: 0.51mm (0.02 in.)

Specifications

For Use With (Equipment) Automatic and Manual Wafer Probing Units
Type Probe Tip
Length (English) 0.23 in.
Length (Metric) 0.58 cm
Material Tungsten
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