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Terra Universal Cleanroom Probe Tips

Electropolished tips reduce contact resistance

Manufacturer:  Terra Universal 911102

Catalog No. 19-111-116


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Description

Description

Tip minimizes breakage and can be used for all automatic and manual wafer probing units.

  • Taper length: 6mm (0.23 in.)
  • Taper angle: 5°
  • Tip radius: 0.0127mm (0.0005 in.)
  • Shank diameter: 0.51mm (0.02 in.)

Specifications

Specifications

0.23 in.
Tungsten
Automatic and manual wafer probing units
0.58cm
Probe Tip
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