- Features yellow filter to block wavelengths shorter than 500nm
- Produces three strong mercury lines at 543, 574 and 576nm
- Particles down to only 10 microns are routinely visible
- Lamp handle fits into transformer base allowing lamp head to rotate 360°
- Scratch-resistant, powder painted aluminum housing
- Cool-touch plastic housing
Semiconductor wafer inspection, fine surface particle detection
Additional filters available (See Cat. No. UVP38-0009-02).
|Fluorescence inspections, non destructive testing, leak detection, readmission|
|UV wafer inspection lamp|
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