Electron Microscopes
Electron Microscopy Sciences Formvar/Carbon Film 10 nm/1 nm thick on Single 200 µm hole Nickel Grid
A formvar coated grid, stabilized with evaporated carbon film. This type of coating is excellent for specimen support, especially for ultra thin sections. Coated grids are optically checked followed by batch testing in the electron microscope. Packed in grid storage box. NOTE: All film is laid on the shiny side of the grid. Formvar is approximately 10 nm thick with 1 nm of carbon.
Grid: Nickel
Electron Microscopy Sciences Formvar/Carbon Film 10 nm/1 nm thick on Single 100 µm hole Copper Grid
A formvar coated grid, stabilized with evaporated carbon film. This type of coating is excellent for specimen support, especially for ultra thin sections. Coated grids are optically checked followed by batch testing in the electron microscope. Packed in grid storage box. NOTE: All film is laid on the shiny side of the grid. Formvar is approximately 10 nm thick with 1 nm of carbon.
Grid: Copper
Electron Microscopy Sciences Formvar/Carbon Film 10 nm/1 nm thick on Single 100 µm hole Nickel Grid
A formvar coated grid, stabilized with evaporated carbon film. This type of coating is excellent for specimen support, especially for ultra thin sections. Coated grids are optically checked followed by batch testing in the electron microscope. Packed in grid storage box. NOTE: All film is laid on the shiny side of the grid. Formvar is approximately 10 nm thick with 1 nm of carbon.
Grid: Nickel
Electron Microscopy Sciences Formvar/Carbon Film 10 nm/1 nm thick on Single 1000 µm hole Nickel Grid
A formvar coated grid, stabilized with evaporated carbon film. This type of coating is excellent for specimen support, especially for ultra thin sections. Coated grids are optically checked followed by batch testing in the electron microscope. Packed in grid storage box. NOTE: All film is laid on the shiny side of the grid. Formvar is approximately 10 nm thick with 1 nm of carbon.
Grid: Nickel
Grainger WESTWARD Scraper Bld Mat Carbon Steel
The Westward Scraper Blade for Material Removal is a carbon steel scraper blade that measures 3 inches wide by 6 inches long. It has a beveled edge and is designed for scraping, cleaning, and removing materials like paint, glue, gasket material, and more from surfaces. This durable hand scraper blade can be used with various scraper handles and holders (sold separately). It is made in the USA.
Sorbent Technologies Inc Alumina, Basic, Act. I, 50-200um, 1kg
Alumina Basic, Standard Activity I is a good all-purpose adsorbent for laboratory as well as process use. It has a pH of 10, a particle distribution of 50-200um, and a quantity of 1kg. The starting activity level of Alumina, Standard Activity I is about half as high as Alumina, Activity Super I and can be deactivated by the addition of polar media (water, alcohols, etc.) according to the deactivation scale. Standardized manufacturing processes provide a specific Brockmann dryness level for lot to lot reproducibility and precise deactivation possibilities. The Loss on Ignition (LOI) is 1.7 +/- 0.2% and the specific surface is ~150 m2/g. The adsorption behavior is extremely constant. Alumina Basic, Standard Activity I may be used for the purification of solvents. Applications include: Alkaloids, essential oils, plant extraction, purification of organic solvents, insecticides, clarification of fatty oils, removal of alcohol from chloroform
Electron Microscopy Sciences Carbon Support Film 5-6 nm thick on Square 200 mesh Nickel Grid
A thin film of pure carbon. All of our coated grids are optically checked followed by batch testing in the EM. Packed in grid storage box. NOTE: All of our film is laid on the shiny side of the grid. Standard thickness is 5-6 nm.
Grid: Nickel
Electron Microscopy Sciences Gel-Pak PortaVac, 1/EA
This lightweight, economical, battery-operated vacuum pump system is designed to unload devices from Gel-Pak Vacuum Release™ Trays. Ideal for low volume manufacturing and R&D applications. Includes 16" hose, 2" vacuum base, and 3-way valve.
Electron Microscopy Sciences TEM Window Pure Silicon, (8) 100 µm, (1) 100x350 µm, 9 nm
Pure Silicon TEM Windows feature imaging windows with 5 to 15 nm thickness, reducing background contribution and interference for higher contrast imaging. The membrane can be vigorously plasma cleaned to remove organic contamination, unlike traditional carbon grids. The elemental silicon composition of TEM Windows remarkably increases stability at high beam currents and at high annealing temperatures. With a minimal background signal, elemental analyses of samples containing nitrogen and/or carbon is possible by EDX and EELS. Nanoporous with pores from 10-60 nm.
Dimensions: (8) 100 µm, (1) 100x350 µm
Thickness: 9 nm
Electron Microscopy Sciences TEM Window Pure Silicon, (8) 100 µm, (1) 100x350 µm, 15nm
Pure Silicon TEM Windows feature imaging windows with 5 to 15 nm thickness, reducing background contribution and interference for higher contrast imaging. The membrane can be vigorously plasma cleaned to remove organic contamination, unlike traditional carbon grids. The elemental silicon composition of TEM Windows remarkably increases stability at high beam currents and at high annealing temperatures. With a minimal background signal, elemental analyses of samples containing nitrogen and/or carbon is possible by EDX and EELS. Nanoporous with pores from 10-60 nm.
Dimensions: (8) 100 µm, (1) 100x350 µm
Thickness: 15nm
Electron Microscopy Sciences TEM Window Pure Silicon, (2) 50x1500 µm, 5 nm
Pure Silicon TEM Windows feature imaging windows with 5 to 15 nm thickness, reducing background contribution and interference for higher contrast imaging. The membrane can be vigorously plasma cleaned to remove organic contamination, unlike traditional carbon grids. The elemental silicon composition of TEM Windows remarkably increases stability at high beam currents and at high annealing temperatures. With a minimal background signal, elemental analyses of samples containing nitrogen and/or carbon is possible by EDX and EELS. Nanoporous with pores from 10-60nm.
Dimensions: (2) 50x1500 µm
Thickness: 5 nm
Electron Microscopy Sciences TEM Window Pure Silicon, (8) 50 µm, (1) 50x100 µm, 5 nm
Pure Silicon TEM Windows feature imaging windows with 5 to 15 nm thickness, reducing background contribution and interference for higher contrast imaging. The membrane can be vigorously plasma cleaned to remove organic contamination, unlike traditional carbon grids. The elemental silicon composition of TEM Windows remarkably increases stability at high beam currents and at high annealing temperatures. With a minimal background signal, elemental analyses of samples containing nitrogen and/or carbon is possible by EDX and EELS. Nanoporous with pores from 10-60nm.
Dimensions: (8) 50 µm, (1) 50x100 µm
Thickness: 5 nm