Electron Microscope Specimen Mounts and Holders
Electron Microscopy Sciences Forensic Certified SEM Mount 8 mm pin
This mount is made from a special certified Aluminum alloy which does not contain any of the objectionable elements that may interfere with samples collected for GSR . These mounts are 12.7 mm x 11 mm.
Electron Microscopy Sciences Hitachi M4, Hitachi M4
SEM specimen holder is 32 mm large double slot set screw vise with (2) 2.5 mm wide x 5 mm deep slots. Clamp thin specimens and cross sections. Machined aluminum with 2 stainless steel allen set screws. Includes allen wrench.
Type: Hitachi M4
Size: 32 mm
Electron Microscopy Sciences Thin Specimen Split Mount, AMRAY, 15 mm
Split SEM specimen holder opens to 3.75 mm. 15 mm dia with 3.2 mm pin. Pin length is 14.3 mm. Height of head: 10.2 mm, centered split. Pin is off-center. Machined aluminum with 2 stainless steel allen set screws. Includes allen wrench.
Electron Microscopy Sciences Large Double Slot Set Screw Vise, 25 mm
SEM specimen holder with two 2.5 mm by 5 mm deep slots. Clamp thin specimens and cross sections without conductive paint or tape. 25 x 8 mm with 3.2 mm pin. Machined aluminum with 2 stainless steel allen set screws. Includes allen wrench.
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1" surface, 3/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1"
Height: 3/8"
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1-1/4" surface, 13/16" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1-1/4"
Height: 13/16"
Electron Microscopy Sciences Standard Pin SEM Stub 90° Double, 1" Head with 3/8" Pin, Aluminum
Double 90° SEM specimen mount with aluminum slotted head for use with FEI, Tescan, Zeiss, Philips, LEO, Cambridge, AMRAY, Leica, CamScan, ETEC. Made from ultra-pure aluminum.
Head: 1"
Pin height: 3/8"
Electron Microscopy Sciences Standard Pin SEM Stub 45° Low Profile 1/2" Head with 3/8" Pin, Aluminum
45° low profile SEM specimen mount for use with FEI, Tescan, Zeiss, Philips, LEO, Cambridge, AMRAY, Leica, CamScan, ETEC. Made from ultra-pure aluminum.
Head: 1/2"
Pin height: 3/8"
Electron Microscopy Sciences AFM/STM 90° Mount w/Spring Clip
These mounts and sample holders make it easy to clamp and position cross sectional samples for AFM imaging. They're easy to attach to the magnetic sample holder of the AFM system. Compatible with most AFM systems on the market. Made from high quality magnetic stainless steel.
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1" surface, 13/16" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1"
Height: 13/16"
Electron Microscopy Sciences Calibration Standard Model 70-1D with Cert Mounted on Pin St
A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: Silicon Oxide ridges on Silicon, 4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. For SEM, this specimen works well at a wide range of accelerating voltages (1 kV to 20 kV have been tested) and calibrates images from 25 kX to 1000 kX.
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1" surface, 13/16" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1"
Height: 13/16"