Microscope Lamps and Accessories
Meiji Techno America SWF10X super widefield eyepiece (Paired), F.N. 23
SWF10X super widefield eyepiece (Paired), F.N. 23
Structure Probe Inc SILVER PASTE 30G
SPI Conductive Silver Paste Plus, Plus is a high purity, Uniform, Viscous silver particle suspension, Ideal for SEM use, Especially for the mounting of porous samples, 30g
Electron Microscopy Sciences Broken Cross Line Reticle RET 50, 19 mm, 13 µm Line width
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 19 mm
Line width: 13 µm
Electron Microscopy Sciences Grain Sizing Reticle NG61, 23 mm
For the determination of non-metallic inclusion content of steel. NG60 meets EN 10247 and NG61 Meets ISO 4976. Both are scaled for use eith 10x objective magnification Pattern
Size: 23 mm
Method: ISO 4967
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1-1/4" surface, 3/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1-1/4"
Height: 3/8"
Electron Microscopy Sciences Carbon Rods, ⅛" diameter, 12" OAL
Technical grade has a typical impurity level of 50ppm or greater and may be used in applications of non critical SEM coating applications.
Diameter: 1/8"
OAL: 12"
Electron Microscopy Sciences Kellner Eyepiece, X10
Focusing eyepiece fits most standard monocular microscope with eyepiece graticules of 16mm diameter. Composed of a convex lens and an achromatic lens so the graticule is brought into sharp focus when superimposed on the object image.
Electron Microscopy Sciences Scanning Electron Microscope Finder Grid, Copper
Finder grids for SEM; a valuable tool for analytical studies. The grids are available in 10 mm diameter and they can be placed directly on the stub surface and used to identify the area of interest in which the studies are performed.