Microscope Lamps and Accessories
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1" surface, 8 mm height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1"
Height: 8 mm
Electron Microscopy Sciences Gilder Aperture Grid with Single 100 µm hole, Copper
Single Slot aperture grids have a thickness of are 50 microns. Aperture diameter is 100 um.
Material: Copper
Electron Microscopy Sciences Chessboard Squares Graticle NE15, 21mm
The dark squares are translucent. Used as an alternative to simple grids for area of specimen determination and paricle counting. Alternative light and dark squares help to reduce eyestrain.
Size: 21mm
Divisions: 2.0 mm squares
Electron Microscopy Sciences Embra Finder 100 mesh Grid, Copper
Standard 3.05 mm diameter grids which have one straight and one round cut out from the rim which assists in the orientation of the grid.
Grid: Copper
Electron Microscopy Sciences Cross Lines Graticle NE82, 16 mm, Nominal line width 0.005 mm
Used as NE50 but for measurements in two directions and for sighting and alignment. Image covers the entire field of view.
Size: 16 mm
Divisions: Nominal line width 0.005 mm
Surface: Chrome image
Electron Microscopy Sciences Gauge Pairs NE19, 16mm
Gauge pairs occupying a field of view of 10 mm. Each gauge is proportional to its adjacent number. The approximately size of the smallest pair = 0.1 mm.
Size: 16 mm
Electron Microscopy Sciences Standard Pin SEM Stub Slotted 3/8" head with 7/16" Pin, Aluminum, 3.1 mm Pin diameter
Small, slotted head pin stub mounts are for Cambridge, LEO, Philips 500, Cameca SEMs. Made from lathe finished ultra-pure aluminum.
Head: 3/8"
Height: 7/16"
Pin diameter: 3.1 mm
Electron Microscopy Sciences Concentric Circles Graticle NE22, 19mm, 0.5 mm - 12 mm diameter
This design leaves the circle clear of obstruction. In addition the intermediate lines are broken to improve ease of reading.
Size: 19mm
Electron Microscopy Sciences Thompson Graticle G23, 21mm
For counting particles in any of three areas of known size. The graticule is calibrated in the same manner as a normal eyepiece scale. The result is then used to calculate the area of any square.
Size: 21mm
Divisions: 10 mm, 7 mm and 4 mm squares
Electron Microscopy Sciences Metallurgical Graticle G42, 21mm, ASTM E112
Standard pattern discs for metallurgical stereometric analysis of grain size in polished metal sections. Grain sizing (E112), Glass Sandwich.
Size: 21mm
Method: ASTM E112
Surface: Glass sandwich
Electron Microscopy Sciences Integrated EyePiece (Simplified) Graticle G50, Custom
The eyepiece reticle has a 100 point integrating pattern. It is a slightly simplified version of G47 pattern.
Size: Custom
Ted Pella Inc ULTRAMICRO-NEEDLE,TGSTN,0.25MM
Ultra Micro-Needle, tungsten, straight, tip radius 5 µm, 0.25mm (0.010")
