Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
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Filtered Search Results
Electron Microscopy Sciences Gilder Parallel Bar Grid G300PB, Nickel
Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected.
Material: Nickel
Pitch: 83 µm
Hole: 48 µm
Bar: 35 µm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Gilder Parallel Bar Grid G100P, Nickel
Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected.
Material: Nickel
Pitch: 250 µm
Hole: 185 µm
Bar: 65 µm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Gilder Parallel Bar Grid G200P, Nickel
Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected.
Material: Nickel
Pitch: 125 µm
Hole: 80 µm
Bar: 45 µm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Gilder Double Oyster Grid 50/100, Nickel
Double grids are used mostly in metallurgical applications for supporting thin metal foils. These grids have a curved securing tab which folds to the curvature of the 'sandwiched' grid. 3.05 mm diameter, 0.7 mil (18um) thickness.
Material: Nickel
Pitch: 500/250 µm
Hole: 430/195 µm
Bar: 70/55 µm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Maxtaform Oval Hole Grid 2 x 1 mm hole, Nickel
High Grade Maxtaform grids with clean and smooth edges, firm support, and a large open area. 3 mm diameter, 0.75 mil thickness.
Size: 2 x 1 mm
Material: Nickel
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Gilder Parallel Bar Grid G100PB, Nickel
Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected.
Material: Nickel
Pitch: 250 µm
Hole: 185 µm
Bar: 65 µm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Scale with Cross Line Microscope Graticle NE77, 16 mm, 5 mm with 100 divisions
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. Horizontal micrometer scale 5mm long in 100 divisions with crosslines. Surface chrome image.
Size: 16 mm
Divisions: 5 mm with 100 divisions
Surface: Chrome image
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Scale with Cross Line Microscope Graticle NE77, 19 mm, 5 mm with 100 divisions
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. Horizontal micrometer scale 5mm long in 100 divisions with crosslines. Surface chrome image.
Size: 19 mm
Divisions: 5 mm with 100 divisions
Surface: Chrome image
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Scale with Cross Line Microscope Graticle NE77, 21 mm, 5 mm with 100 divisions
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. Horizontal micrometer scale 5mm long in 100 divisions with crosslines. Surface chrome image.
Size: 21 mm
Divisions: 5 mm with 100 divisions
Surface: Chrome image
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Scanning Electron Microscope Finder Grid, Nickel
Finder grids for SEM; a valuable tool for analytical studies. The grids are available in 10 mm diameter and they can be placed directly on the stub surface and used to identify the area of interest in which the studies are performed.
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Reference Stage Graticule 75 mmx25 mm Slide
High precision image analysis standard provides four test areas for calibrating image analysis systems and identifying deviations and distortions in optical imaging systems. It is produced on a 75 mm x 25 mm slide and has a square grid accuracy of +/-0.1um and a dot accuracy of +/-0.3um.
The four test areas are:
400 um x 400 um square grid subdivided into 200, 100, 50 and 25 micron squares for detecting gross image distortions and can be used as an accurate two dimensional stage micrometer.
A 20 x 17 array of nominally 15 um diameter dots is used to identify lens distortions.
A root-2 array of spots from 3 um to 48 um diameter is used for determining the threshold levels of cameras and microscopes.
A log-normal distribution array of 100 spots ranging from 4.5 um to 27 um diameter enables the mean and standard deviation to be determined and compared with certified values. This is an idealized distribution of maximum dynamic range for a full screen.
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Abcam TMCB, Selective CK2 inhibitor, 50MG
MW 534.82 Da, Purity >98%. CK2 inhibitor (Ki = 0.25 μM), more selective than DMAT. Unlike DMAT, TMCB displays selectivity over PIM1, HIPK2 and DYRK1a (Ki values are 8.65, 15.25 and 11.90 μM, respectively) and a more favourable selectivity profile over a range of other kinases.
The product is subject to the following: Abcam Restricted Use Statement
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences BEEM Blocklock Storage Box for #69956
Specimen blocks are safely stored in Blocklock storage modules, a component in the BEEM Specimen Storage System 2000. All Blocklocks can be inserted in a Plastic Protective Box or, by utilizing the adhesive feature, mounted in combination with other Blocklock modules on the BEEM mounting panel that fits in a standard " D-Type" 3-ring binder. Heavy-duty, two tone plastic box supplied with indexed translucent labels for top or bottom of the box. Storage for #69956
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Chalkley Point Array Graticle NG52, 16mm
Eyepiece graticle is used to quickly determine the relationship of components to each other using random sampling. Curtis gives an example of its application, where a researcher may want to see whether or not a certain drug affects the volume proportion of cell types in a given organ. With this graticule the proportion of points lying over the image of one type of component is statistically proportional to the area occupied by that component. The 25 points of the array are placed over the field of view at random, so that a comparison can be made between the number of points touching the one type of component, with number touching the other type of component in each viewing. A series of observations will yield an increasingly accurate ratio of the comparative incidence of each type of particle.
Size: 16 mm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences SEM Hitachi Mounts Rectangular 11 mm x 5.5 mm, 3.5 mm height
Rectangular SEM specimen mounts for use with Hitachi S-5200/S-5500/SU-9000. Made from ultra-pure aluminum. Available in 11 mm x 5.5 mm with 2, 3.5, 5 or 5..5 mm height.
Size: 3.5 mm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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