Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
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Filtered Search Results
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1" surface, 3/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1"
Height: 3/8"
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Shorter Pin SEM Stub 45° Low Profile, 1/2" Head with 1/4" Pin, Aluminum
45° Low Profile SEM stub specimen mount with shorter pin (6 mm) and 45 degree mounting surfaces for use with Zeiss/LEO scanning electron microscopes, FE-SEMs & FIB systems. Made from ultra-pure aluminum with a standard lathe finish.
Head: 1/2"
Pin height: 1/4"
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences SEM Stub Tool with Perspex handle
A useful tool for assisting in loading and unloading SEM pin stubs from a loading stand or specimen box into the microscope. It features a Perspex handle with beryllium copper pins that give the tool a flexible, but stable, grip on the specimen stub.
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences 8x Loupe with Scale, 30 mm Field of vision
Loupe with 8x magnification.
OD: 24 mm
Scale: 10 mm with 0.1 mm divisions
Field of vision: 30 mm
Weight: 30 g
Dimension: 40x40x44mm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Ultra Thin Carbon Tabs, 12 mm
Core material which is nonconductive cloth (70 um) with carbon Filler Conductive Adhesive (2 x 45μ). Total thickness is 160 µn;.
Diameter: 12 mm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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KLARMANN RULINGS INC Miller Disc Reticle Corner, 20 mm
A squared reticle can be used for counting. Here the basic principle is that a small area of the specimen is analyzed in order to obtain information about the total area. This removes much irksome work and is preferable in certain instances to analyzing the whole area. For example when it is desired to compare the proportion of large to small particles in a specimen, by using the Miller Disc, the smaller particles may be counted only in the small square, the result being multiplied by ten for comparison with the number of larger particles in the large square.
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Formvar/Carbon Film 10 nm/1 nm thick on Square 300 mesh Copper Grid
A formvar coated grid, stabilized with evaporated carbon film. This type of coating is excellent for specimen support, especially for ultra thin sections. All of our coated grids are optically checked followed by batch testing in the EM. Packed in grid storage box. NOTE: All of our film is laid on the shiny side of the grid. Formvar is approximately 10 nm thick with 1 nm of carbon.
Grid: Copper
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-2/1-4C, 400 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 2.0 µm holes with 1.0 µm spacing.
Mesh: 400
Material: Copper
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Standard Pin SEM Stub 3-Division 18 mm Head with 9 mm Pin, Aluminum, 3.2 mm Pin diameter
Pin stub mount with 3 divisions for use with FEI, Phillips, LEO, Zeiss, Cambridge, Leica, Amray, Tescan and Camscan SEMs. Made from ultra-pure aluminum with a standard lathe finish.
Head: 18 mm
Pin height: 9 mm
Pin diameter: 3.2 mm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences JEOL SEM Cylinder Mount 1-1/4" surface, 13/16" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1-1/4"
Height: 13/16"
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences JEOL SEM Cylinder Mount 1-1/4" surface, 13/16" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1-1/4"
Height: 13/16"
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Static Master 3" Replacement Cartridge
Easily install a new cartridge without returning the brush to the factory.
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Veco Square Center Reference 400 mesh Gold Grid
Veco Grids offer superior handling characteristics. Plus, with a 0.8 mil thickness, Veco Grids are the most rigid grids available. 3.05 mm diameter.
Grid: Gold
Pitch: 63 µm
Hole: 30 µm
Bar: 33 µm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Single Line Graticle NE50, 21mm, 0.02 mm Line width
For measurement of large objects and alignment in conjunction with a graduated mechanical stage. Single line, nominal width 0.02 mm, image covers entire field of view, surface chrome image.
Size: 21mm
Line width: 0.02 mm
Surface: Chrome image
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Gilder Single Slot Oval Grid GS2x1, Copper, 2000 x 1000 µm Slot
Single Slot TEM Grids with oval holes have a thickness of are 50 microns. Each grid is individually inspected.
Material: Copper
Slot: 2000 x 1000 µm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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