Electron Microscopes
Electron Microscope Accessories
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Electron Microscopy Supplies
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Scanning Electron Microscopes
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Electron Microscopy Sample Preparation Systems
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Ted Pella Inc 45º SEM Mount, 10/pack
45º SEM Mount Ø12.7mm for FEI, TESCAN, ZEISS (also for Philips, LEO, Cambridge, AMRAY, Leica, CamScan, ETEC) SEMs. Aluminum, grooved edge, 7.8mm pin height.
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Electron Microscopy Sciences Multi Pin Stub Adapter, JEOL
This multi pin stub adapter for JEOL is designed to save time. It is made from vacuum aluminum with stainless steel set screws. It accommodates up to four standard 12.7 mm (1/2") pin stubs with 3.2 mm (1/8") pin.
Type: JEOL
3,825
Enterprise Technology Solutions Surface Mount ES Everywhere Sy
Surface Mount Es Everywhere System White 8/pack
