Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
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Filtered Search Results
Electron Microscopy Sciences Crossed Scale Microscope Graticle NE70 (imperial), 23 mm, 0.8' with 400 divisions of 0.002"
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. Crossed Micrometer scale (imperial).
Size: 23 mm
Divisions: 0.8' with 400 divisions of 0.002"
Surface: Chrome image
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences V-2 Quality, 9.5 mm diameter, 0.15- 0.21 mm thick
EMS Mica Sheets offer a clean surface for EM applications, carbon filming and particle spraying, as well as for AFM applications. There are two types of mica: muscovite and phlogopite. Generally, one differs from the other by color (Muscovite is Ruby, Green or White; Phlogopite is Amber, Yellow, or Silver). The maximum operating temperature for Muscovite is about 500-600 degree C and for Phlogopite is about 800-900 degree C. Our line consists of High Quality Muscovite Mica. This mica peels off very thin up to 0.0001" uniform layers, exposing "virgin" mica upon splitting.Muscovite, potash type mica, sometimes known as granitic mica, is the best of all micas in dielectric strength, perfection of cleavage, and transparency. It has the chemical formula: H2KAI3(Si04)3. Clear and Slightly Stained. Hard, uniform color, nearly flat and slight crystallographic discoloration.Quality: V-2Size: 9.5 mm diaThickness: 0.15- 0.21 mm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Gilder Hexagonal 300 mesh Gold Grid
A reliable support specimen grid source. Features: well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected. The copper grids with palladium plating offers better grid strength and avoids tarnishing. 3.05 mm diameter, 0.7 mil (18um) thickness.
Grid: Gold
Pitch: 83 µm
Hole: 58 µm
Bar: 25 µm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-2/4-2C, 200 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 2.0 µm holes with 4.0 µm spacing.
Mesh: 200
Material: Copper
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Scale with Cross Line Microscope Graticle NE7, 20.4 mm, 10 mm with 0.1 mm spacing
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. Horizontal micrometer scale 10mm long with crosslines at 0.1mm spacing. Surface chrome image.
Size: 20.4 mm
Divisions: 10 mm with 0.1 mm spacing
Surface: Chrome image
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences High Resolution Magnification Calibration Specimen 150-2DUTC for AFM
Model 150-2D is a very high resolution reference and traceable standards for magnification calibration of AFM, SEM, Auger, and FIB. It has a precision, holographic pattern that provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.
The period is 144 nm pitch, two-dimensional array that is accurate to +/- 1 nm (calibration certificate will have actual pitch.) Surface: Aluminum bumps on Silicon, 4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.
For SEM an independent analytical lab has tested this specimen in a FE-SEM and found that the pattern was very uniform and the specimen was easy to image. No significant charging was observed in the voltage range 1-20 kV. This traceable, Certified Standard is a select grade.
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Ala Scientific Instruments Inc HARP SLICE GRIDS (5-PACK)
Small and Specialty Supplier Partner
Small and/or specialty supplier based on Federal laws and SBA requirements.
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Small and/or specialty supplier based on Federal laws and SBA requirements.
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6.4mm ID, 8mm OD1mm thick, 0.1gnylon mesh
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Crossed Scale Microscope Graticle NE70 (imperial), 24 mm, 0.8' with 400 divisions of 0.002"
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. Crossed Micrometer scale (imperial).
Size: 24 mm
Divisions: 0.8' with 400 divisions of 0.002"
Surface: Chrome image
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Scale Reticle RET 10, 19 mm, 10 mm Scale, 0.1 mm x 100 Divisions
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 19 mm
Scale: 10 mm
Divisions: 0.1 mm x 100
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Matthews Spray Droplet Graticle NE30, 21mm
For size and distribution assessments of aersol droplets. Used in conjunction with a 40X Microscope for direct measurements of droplets from 50-400 micron diameters. The actual pattern sizes are 50, 100, 200, and 400 microns. W.H.O. (Details on Request) and G.A. Matthews. Imperial College.
Size: 21 mm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Matthews Spray Droplet Graticle NE30, 23mm
For size and distribution assessments of aersol droplets. Used in conjunction with a 40X Microscope for direct measurements of droplets from 50-400 micron diameters. The actual pattern sizes are 50, 100, 200, and 400 microns. W.H.O. (Details on Request) and G.A. Matthews. Imperial College.
Size: 23 mm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Matthews Spray Droplet Graticle NE30, 16mm
For size and distribution assessments of aersol droplets. Used in conjunction with a 40X Microscope for direct measurements of droplets from 50-400 micron diameters. The actual pattern sizes are 50, 100, 200, and 400 microns. W.H.O. (Details on Request) and G.A. Matthews. Imperial College.
Size: 16 mm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Structure Probe Inc SILVER PASTE 30G
SPI Conductive Silver Paste Plus, Plus is a high purity, Uniform, Viscous silver particle suspension, Ideal for SEM use, Especially for the mounting of porous samples, 30g
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-2/2-4C, 400 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 2.0 µm holes with 2.0 µm spacing.
Mesh: 400
Material: Copper
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences SEM Hitachi M4 Double 90°, 1" Head with 16 mm Pin, Aluminum
Hitachi double 90 degree SEM mounts are made from lathe finished ultra-pure aluminum.
Head: 1"
Height: 16 mm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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