Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences SEM Hitachi M4 45°, 5/8" head, 3/8" height, Aluminum
45 degree SEM specimen mount with aluminum slotted head for use with Hitachi. Made from ultra-pure aluminum.
Head: 5/8"
Height: 3/8"
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-1.2/1.3-3C-Thick, 300 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 1.2 µm holes with 1.3 µm spacing.
Mesh: 300
Material: Copper
Electron Microscopy Sciences Chalkley Point Array Graticle NG52, 16mm
Eyepiece graticle is used to quickly determine the relationship of components to each other using random sampling. Curtis gives an example of its application, where a researcher may want to see whether or not a certain drug affects the volume proportion of cell types in a given organ. With this graticule the proportion of points lying over the image of one type of component is statistically proportional to the area occupied by that component. The 25 points of the array are placed over the field of view at random, so that a comparison can be made between the number of points touching the one type of component, with number touching the other type of component in each viewing. A series of observations will yield an increasingly accurate ratio of the comparative incidence of each type of particle.
Size: 16 mm
Electron Microscopy Sciences Write on Marker Pens, 1/EA
These pens are made from specially formulated ink and are to be used on anterior surfaces as well as sides of histology cassettes. The ink will dry almost instantly and withstands temperatures up to 195 degree C and is resistant to solvents.
Electron Microscopy Sciences Wafer Cleaving Kit with Mat
The complete tool set to scribe and cleave cleanly. This is a critical step to getting the best cross-sections. The kit includes two diamond scribes for marking and scribing (straight tip and 30 degree tip), a pen-style diamond scribe, tweezers with black soft fiber fine tip (length 6.25 in), wafer cleaning pliers, a clear plastic ruler with metric and US units, and tungsten cleaving wire. This kit is suitable for a wide variety of substrates and wafers (Si, GaAs, glass). Includes 12x18 in wafer mat.
Electron Microscopy Sciences Thin Sample Holder, 8 mm Pin
Ideal for examination cross section of thin samples, such as wafers, multi-layer of capacitors, plastics, metals, etc. For most AMRAY: 1/2" diameter (12.7mm), 1/8" (3.1mm)dia. Pin (3.1mm) with split openings up to 1/4" (6.4mm), with 8mm (5/16") pin height
World Precision Instrument Kite Manual Micromanipulator-KITE-M3-R
The KITE is an economical manual micromanipulator that is perfect for student use. It is available in right or left hand versions and is also sold bundled with an optional M3 Tilting Base. Our 5 lb. weight (WPI #5464) is frequently sold with this unit to provide stability.
Electron Microscopy Sciences PremaDisk S-EC Diamond Grinding Disc, 300 mm diameter, 30µm Particles
These new universal grinding pads for all magnetic systems will replace 200-300 SiC paper discs saving you not only preparation time, but also money. The very high stock removal rate results in fast and clean mounting. Thickness of 0.2 mm with a non-erosion backing. Only water coolant is needed. Replacement for Piano, Cameo, Galaxy, and Apex DGD.
Diameter: 300 mm
Particles: 30µm
Electron Microscopy Sciences Tripod Polisher PrecISIon Locking Micrometer
Special larger diameter locking rings for easy locking and are graduated in one micron increments with 13mm travel. Non-coating Micrometers not recommended. - For use with Tripod Polisher.
Electron Microscopy Sciences Gilder Finder Grid F1, 200 mesh, Copper/Palladium
Used to identify specific areas of mesh by an alphabetical or numerical code built into the mesh. 3.05 mm diameter, 0.7 mil (18 um) thickness. Series has thick bars dividing regions into 6 thin bar areas identified by a numeric system.
Grid: Copper/Palladium
Pitch: 125 µm
Hole: 90-100 µm
Bar: 35-12 µm
Electron Microscopy Sciences EMS Platinum Aperture with 100 µm hole, 0.24 mm thick
Platinum apertures are easily cleaned by either an aperture flamer or over a bunsen burner in the open air. We maintain a wide variety of Platinum Drilled Apertures in stock with different configurations suiting all of your needs. Nominal hole diameter: +/- 1 micron. Disc diameter: +/- 10 microns. Disc thickness: +/- 10 microns
Size: 100 µm
O.D.: 2 mm
Thickness: 0.24 mm
Electron Microscopy Sciences MicroMounts™ Crystal Tool with Assortment A1, 11 mm pin
MicroMounts are the high performance tools for manipulating and mounting protein crystals, virus crystals, and small molecule/inorganic crystals, and other small, fragile samples. They are ideal for both conventional and high-throughput X-ray crystallography applications.
Each consist of a thin (7.5um thick) micro-fabricated polyimide film, attached to a solid non-magnetic stainless steel pin. Film is wrapped around the steel pin and it provides excellent stiffness and convenient scoop-like action in retrieving and handling crystals. Includes: 10, 20, 30 and 40 um apertures.
Aperture: 11 mm pin
Electron Microscopy Sciences Pharmaceutical PSA Pattern Graticle G-57, 23 mm, Glass sandwich
This graticule was designed for the pharmaceutical industry. However, it is also useful where particle size considerations are restricted to 10 mm and 25 mm. Dots and circles give quick references for these two sizes. In addition a scale is incorporated. The microscope must be calibrated when ordering this graticule, such that the circle must equate to 1 mm on the microscope stage.
Size: 23 mm
Surface: Glass sandwich
Electron Microscopy Sciences TEM Screen Recoating JEOL 100c, 100cx, 200cx, Inner Rec
For optimum viewing, fluorescent screens should be recoated regularly. Viewing screens are easily damaged by the electron beam, especially at high accelerating voltages where knock-on damage can be severe. A proprietary process where 1 to 2 micron particles of phosphor are deposited on the screen and produce the highest possible resolution.
Electron Microscopy Sciences Stage Micrometer S16, Crossed scale Scale, 1 mm Length
Stage graticules are used for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same graticule in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centered on a glass disc mounted in a black anodized aluminum slide 75 mm x 24 mm x 2 mm thick.
Scale: Crossed scale
Length: 1 mm
Divisions: 100 each 0.01 mm