Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences Standard Pin SEM Stub Slotted 1" head with 1/2" Pin, Aluminum, 3.1 mm Pin diameter
Scanning electron microscope specimen mounts for FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan and Camscan SEMs. Made from lathe finished ultra-pure aluminum.
Head: 1"
Pin height: 1/2"
Pin diameter: 3.1 mm
Electron Microscopy Sciences Standard Pin SEM Stub Slotted 3/8" head with 7/16" Pin, Aluminum, 3.1 mm Pin diameter
Small, slotted head pin stub mounts are for Cambridge, LEO, Philips 500, Cameca SEMs. Made from lathe finished ultra-pure aluminum.
Head: 3/8"
Height: 7/16"
Pin diameter: 3.1 mm
Electron Microscopy Sciences SEM Mount Hitachi M4 1" Plain Surface, 1/4" height, Aluminum
Hitachi cylinder mount has a M4 tapered hole with female thread. Made from lathe finished ultra-pure aluminum. M4 tapered hole.
Head: 1"
Height: 6 mm
Electron Microscopy Sciences Hitachi SEM Cylinder Mount 9/16", 3/8" height, Aluminum
Hitachi SEM mounts are made from lathe finished ultra-pure aluminum.
Electron Microscopy Sciences Standard Pin SEM Stub Large slotted 1-1/4" head with 1/2" Pin, Aluminum, 1/8" Pin diameter
Large slotted head pin stub mount are for Leica, Cambridge, LEO, FEI, Phillips, Zeiss, and Camscan SEMs specimen mounts. Made from lathe finished ultra-pure aluminum.
Head: 1-1/4"
Pin height: 1/2"
Pin diameter: 1/8"
Electron Microscopy Sciences SEM Stub Hitachi Cylinder 5/8" surface, 1/2"height, Aluminum
Hitachi SEM mounts are made from lathe finished ultra-pure aluminum.
Head: 5/8"
Height: 1/2"
Electron Microscopy Sciences X-Checker™ Calibration Aid for SEM/EDS Standard
The X-Checker was the first and remains the only complete calibration aid for SEM/EDS Systems. Each X-Checker comes with manganese to measure full width at half max detector resolution, aluminum and copper to perform spectral calibration, and carbon to monitor calibration at the low end of the spectra for thin window detectors. You also get two grid sizes for checking the accuracy of your image analysis software and an easy test for monitoring the amount of vacuum pump oil contamination on your detector window. Comes with: manganese, aluminum and copper, carbon.
Electron Microscopy Sciences X-Checker™ Calibration Aid for SEM/EDS Extra
The X-Checker was the first and remains the only complete calibration aid for SEM/EDS Systems. Each X-Checker comes with manganese to measure full width at half max detector resolution, aluminum and copper to perform spectral calibration, and carbon to monitor calibration at the low end of the spectra for thin window detectors. You also get two grid sizes for checking the accuracy of your image analysis software and an easy test for monitoring the amount of vacuum pump oil contamination on your detector window. With: manganese, aluminum and copper, carbon, a fluorine source.
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-2/4-4C, 400 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 2.0 µm holes with 4.0 µm spacing.
Mesh: 400
Material: Copper
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-1.2/1.3-4C, 400 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 1.2 µm holes with 1.3 µm spacing.
Mesh: 400
Material: Copper
Electron Microscopy Sciences Cork Discs, 20 mm x 3 mm, 100/pk
These discs are 20 mm diameter and are 3 mm thick. Perfect to be used with a cryostat.
Electron Microscopy Sciences CoverWell™ Perfusion Chamber 1 well with 520 µl volume
CoverWell Perfusion Chambers allows up to 16 different specimens on one coverglass. "Press-to-Seal" covers form water-tight, multiwall cell incubation or cytochemistry chamber when pressed to coverslips or microscope slides. Reagents can be quickly added and removed through dual access ports (1.5 mm Dia) without disturbing or cross-contaminating specimens in adjacent wells. Chambers are removable for permanent mounting of specimens. CoverWell chambers are made from medical grade silicone bonded to clear, UV transparent plastic.
Volume: 520 µl
Electron Microscopy Sciences EMS Calibration Micrometer Model ACM-1
This ideal standard provides accurate calibration of any eyepiece, reticules, filar micrometers, or electronic measuring instrument. Features a series of ʽH' shaped fiducial images in a range of sizes from 0.1 mm through 20 mm, useful for calibration range from 1X to 1000X power.
Electron Microscopy Sciences EMS Stage Micrometer, SM-1
Chrome on Glass. Linear Reference Scales: Glass size - 2" x 5.25". Scale Length - 5 inch X-axis only, 125 mm X-axis only. Divisions - English = 0.01”; Metric = 100um (0.1 mm). With numerical labeling every 1 mm and 0.1”
