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Electron microscopes are instruments that use a beam of electrons to provide a high resolution image. Techniques include scanning, transmission and focused ion beam electron microscopy, and X-ray microtomography. Available in desktop size.
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Copper Conductive Tape, 6.3mm W x 16.4m L; 1/4 in. x 18yd, Core diameter is 76mm, Foil Thickness: 0.04mm, Total Thickness: 0.07mm, Resistance through Adhesive: 0.005ohm
Encompass Procurement Services Non-distribution item offered as a customer accommodation; additional freight charges may apply. Learn More
Small and Specialty Supplier Partner Small and/or specialty supplier based on Federal laws and SBA requirements. Learn More
This 62 mm in diameter multi pin holder is designed to save time. It is made from machined aluminum with stainless steel Allen wrench screws. It accommodates up to twelve standard 12.7 mm (1/2") pin stubs Type: Zeiss with Built-in Dovetail
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Highest quality type 316L stainless steel IM pins. Available in the points and diameters listed below. When ordering, please match diameter with point style number. Made in U.S.A.
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Small and Specialty Supplier Partner Small and/or specialty supplier based on Federal laws and SBA requirements. Learn More
These wafer holders are made from aluminum and feature brass clips which secure the wafers. Each holder comes with a 0.125" (3.2 mm) pin of 0.375" (9.5 mm) length. Accomodates 4" (100 mm) diameter wafer. Size: 100 mm
Encompass Procurement Services Non-distribution item offered as a customer accommodation; additional freight charges may apply. Learn More
Small and Specialty Supplier Partner Small and/or specialty supplier based on Federal laws and SBA requirements. Learn More
70° low profile SEM specimen mount for use with FEI, Tescan, Zeiss, Philips, LEO, Cambridge, AMRAY, Leica, CamScan, ETEC. Made from ultra-pure aluminum. Head: 1/2" Pin height: 3/8"
Encompass Procurement Services Non-distribution item offered as a customer accommodation; additional freight charges may apply. Learn More
Small and Specialty Supplier Partner Small and/or specialty supplier based on Federal laws and SBA requirements. Learn More
Mini SEM stub specimen mount with shorter pin (6 mm) for use with all Zeiss/LEO scanning electron microscopes, FE-SEMs & FIB systems. Made of stainless steel. Head: 6.6 x 1.3 mm Pin height: 6.25 mm
Encompass Procurement Services Non-distribution item offered as a customer accommodation; additional freight charges may apply. Learn More
Small and Specialty Supplier Partner Small and/or specialty supplier based on Federal laws and SBA requirements. Learn More
45°/90° SEM specimen mount with aluminum slotted head for use with FEI, Tescan, Zeiss, Philips, LEO, Cambridge, AMRAY, Leica, CamScan, ETEC. Made from ultra-pure aluminum. Head: 1" Pin height: 3/8"
Encompass Procurement Services Non-distribution item offered as a customer accommodation; additional freight charges may apply. Learn More