Electron Microscope Accessories
Electron Microscopy Sciences Calibration Specimen 300-1D, Choose a mount
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Parallel Ridges. Pitch 288 W-coated Photoresist on Si Use contact or Tapping Mode.
Mount: Choose a mount
Electron Microscopy Sciences Calibration Specimen 300-1D, Steel disk for AFM
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Parallel Ridges. Pitch 288 W-coated Photoresist on Si Use contact or Tapping Mode.
Mount: AFM
Electron Microscopy Sciences Dual Micrometer Calibration Slide PS52N with UKAS
Dual imperial/metric scales calibration slide. 50 mm in 0.1 mm divisions and 2" in 0.005" divisions. In wooden case. Ideal for calibrating optical products with a large field of view, such as stereo microscopes or imaging systems. Negative pattern formed in low reflective chrome for incident light applications. 76 mm x 25 mm.
Electron Microscopy Sciences Gilder Standard Square 150 mesh Gold Grid
A reliable support specimen grid source. Features well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected. 3.05 mm diameter, 0.7 mil (18 um) thickness.
Grid: Gold
Pitch: 165 µm
Hole: 125 µm
Bar: 40 µm
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Electron Microscopy Sciences Gilder Aperture Grid with Single 50 µm hole, Copper
Single Slot aperture grids have a thickness of are 50 microns. Aperture diameter is 50 um.
Material: Copper
Electron Microscopy Sciences Gilder Single Slot Oval Grid G102, Copper, 1000 x 200 µm Slot
Single Slot TEM Grids with oval holes have a thickness of are 50 microns. Each grid is individually inspected.
Material: Copper
Slot: 1000 x 200 µm
Electron Microscopy Sciences Gilder Aperture Grid with Single 100 µm hole, Gold
Single Slot aperture grids have a thickness of are 50 microns. Aperture diameter is 100 um.
Material: Gold
Electron Microscopy Sciences EMS Molybdenum Aperture with 150 µm hole, 2 mm O.D., 0.24 mm thick
Molybdenum disc aperture with 150 um hole for use with Phillips and Cameca electron microscopes.
O.D.: 2 mm
Thickness: 0.24 mm
Electron Microscopy Sciences EMS Molybdenum Aperture with 50 µm hole, 2 mm O.D., 0.53 mm thick
O.D.: 2 mm
Thickness: 0.53 mm
Electron Microscopy Sciences EMS Molybdenum Aperture with 200 µm hole, 3 mm O.D., 0.24 mm thick
O.D.: 3 mm
Thickness: 0.24 mm
Electron Microscopy Sciences EMS Molybdenum Aperture with 10 µm hole, 4 mm O.D., 0.165 mm thick
O.D.: 3 mm
Thickness: 0.165 mm
Electron Microscopy Sciences EMS Molybdenum Aperture with 70 µm hole, 3 mm O.D., 0.24 mm thick
O.D.: 3 mm
Thickness: 0.24 mm
Electron Microscopy Sciences Variable Size Geological Thin Section Holder, Hitachi M4
This thin section holder is made from vacuum grade aluminum with copper clips and brass screws . The unit measures 51x32x8 mm and holds either standard thin sections of 47 x 27 mm or smaller or larger thin sections. Smallest size would be 40x20 mm. The holder comes complete with 2 clips to insure nothing moves. The holder has convenient tweezer inserts which allow for easy loading.
Type: Hitachi M4
Electron Microscopy Sciences EMS Molybdenum Aperture with 50 µm hole, 6 mm O.D., 0.24 mm thick
O.D.: 6 mm
Thickness: 0.24 mm
Electron Microscopy Sciences EMS Molybdenum Aperture with 10 µm hole, 6.35 mm O.D., 0.006 mm thick
Molybdenum disc aperture with30 um hole for use with ETEC electron microscopes.
O.D.: 6.35 mm
Thickness: 0.006 mm