Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences Reference Stage Graticule 75 mmx25 mm Slide
High precision image analysis standard provides four test areas for calibrating image analysis systems and identifying deviations and distortions in optical imaging systems. It is produced on a 75 mm x 25 mm slide and has a square grid accuracy of +/-0.1um and a dot accuracy of +/-0.3um.
The four test areas are:
400 um x 400 um square grid subdivided into 200, 100, 50 and 25 micron squares for detecting gross image distortions and can be used as an accurate two dimensional stage micrometer.
A 20 x 17 array of nominally 15 um diameter dots is used to identify lens distortions.
A root-2 array of spots from 3 um to 48 um diameter is used for determining the threshold levels of cameras and microscopes.
A log-normal distribution array of 100 spots ranging from 4.5 um to 27 um diameter enables the mean and standard deviation to be determined and compared with certified values. This is an idealized distribution of maximum dynamic range for a full screen.
Electron Microscopy Sciences Tripod Polisher Model 590, Kit for TEM
The Tripod Polisher is used to prepare accurately micro sizes of TEM and SEM samples. For TEM samples, the Tripod Polisher iis used to limit ion milling times to less than 15 minutes, and in some cases, has eliminated the need for ion milling. It can be used to prepare both plan-view and cross-sections from a variety of sample materials, such as ceramics, composites, metals, and geological specimens. It has limited ion milling requirements that reduce preferential thinning, radiation damage, and heating of the sample. No strong chemicals are used to prepare the specimen.
Electron Microscopy Sciences PS12 Micrometer Standard with Graticules Cert
These stage micrometers are available with a calibration certificate that provides traceability for the precise calibration and confirmation of accuracy of optical measuring instruments, necessary under ISO provisions. The glass discs are mounted in stainless steel slides with engraved serial numbers. Each slide is supplied in a polished wooden storage case. A Certificate of Comparison from Pyser-SGI, Graticules Division compares the scale to a NPL calibrated in-house standards. A statemen is provided on the accuracy of the item with respect to these standards.
Micro Tech Optical Inc 6V 20W MICROSCOPE BULB
This item has a minimum qty of 3 per supplier requirements.
6V 20W MICROSCOPE BULB
Cole-Parmer Meiji Techno MA593 Replacement Stage Clips 60mm L x 8mm W; 2/Pk
Change your scope's capabilities or keep it operating smoothly with these parts and accessories.
Electron Microscopy Sciences Optical Resolution Grating with Ronchi Ruling 125 lines/ mm
Metallic grating pattern on glass squares with opaque lines approximately 50% of the pitch. Stock items are on 50 mm x 50 mm squares of glass 1.5 mm thick. The glass is B270 with refractive index of 1.52. Mutually perpendicular pairs produce a screen of square apertures. Vacuum deposited chrome gratings on glass substrate. Typically used for testing of resolution, field distortion and parfocal stability, but may be paired to provide interference patterns. 50mm x 50mm B270 glass. 125 lines per mm ruled over 30mm
Enzo Life Sciences NS-2028 (1mg). CAS: 204326-43-2
A potent and selective, cell-permeable inhibitor of nitric oxide (NO)-sensitive soluble guanylyl cyclase (sGC). Inhibition is irreversible. Inhibits also the basal, the YC-1 and the coenhanced sGC activity. Complete inhibition of NO-induced relaxation in vascular and nonvascular smooth muscle at 1μM. Alternative name: 4H-8-Bromo-1,2,4-oxadiazolo(3,4-d)benz(b)(1,4)oxazin-1-one. Formula: C9H5BrN2O3. MW: 269.1. Purity: ≥98% (TLC). Appearance: White to off-white crystalline powder. Solubility: Soluble in DMSO or 100% ethanol; insoluble in water. Long Term Storage: -20°C. Handling: Protect from moisture.
Electron Microscopy Sciences PremaDisk Diamond Grinding Disc SH Hard Bond, 6 µm Particles, 250 mm diameter
PremaDisk Flexible Diamond Grinding Discs offer superior surface finishes that are usually only seen in lapping processes.
The SM disc is a medium-hard resin bond base for fine grinding and polishing of metals, ceramics and glass.
The SH disc is a hard resin bond base for applications where a very sharp edge must be maintained on the workpiece.
Both discs increase productivity by combining optimum surface quality, removal rates, and tool life in the same process.
Particles: 6 µm
Diameter: 250 mm
Electron Microscopy Sciences Indexed Grid Graticle NE11A, 19 mm, 10 x 10 mm with 1.0 mm pitch
Useful for particle counting, particularly when reference is needed between workers. Also, they are useful for area of specimen determinations. Indexed grid marked 1-10 and A-J.
Size: 19 mm
Divisions: 10 x 10 mm with 1.0 mm pitch
Surface: Chrome image
Electron Microscopy Sciences Microscope Slide End Label SES-16-RC, Standard, 15/32" x 15/16"
These specialty Microscope Slide Labels and matching End Labels are available in standard (thin) or pathology (tissue high) thickness, and square or round corner (RC). Permanent adhesive holds labels in place during use and long-term storage. Sheet Form Size is 5 1/4" x 8". Standard thin thickness. Round corners.
Use: Standard
Size: 15/32" x 15/16"
Electron Microscopy Sciences Gilder Thin Bar Square 400 mesh Gold Grid
Thin Bar Grids have been developed using a new technology to produce ultra-fine grids with thinner cross bars than regular grids. The result is equally firm specimen support but with 40% more open area for viewing maximum specimen surface area. 3.05 diameter, 0.8 mil thickness.
Grid: Gold
Pitch: 62 µm
Hole: 54 µm
Bar: 8 µm
:
Electron Microscopy Sciences Ultra Smooth Carbon Adhesive Tabs, 12 mm
Thin film of strong adhesive 1⁄2" diameter, over 99% transparent to EDS. With nickel (0.6%) and copper (< 0.3%). Used for gunshots residues. Small nonconductive particles can imaged and X-Rayed without conductiv coating.
Diameter: 12 mm
Electron Microscopy Sciences EMS Tungsten Loop Filament New, Hitachi S-Type
Our Electron microscope Tungsten filaments have a rigid attachment of the filament wire to the post with no possiblity of waving and a minimum tip radius for a coherent beam. The base assembly of all of our new filaments are guaranteed to be rebuildable for the lifetime of the electron beam instrument. Inspected for consistent quality and performance before being shipped to you. Return the base and we will rebuild the filament.
Use: Hitachi S-Type
Electron Microscopy Sciences High Resolution Magnification Calibration 150-2DUTC Choose the mount
Model 150-2D is a very high resolution reference and traceable standards for magnification calibration of AFM, SEM, Auger, and FIB. It has a precision, holographic pattern that provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.
The period is 144 nm pitch, two-dimensional array that is accurate to +/- 1 nm (calibration certificate will have actual pitch.) Surface: Aluminum bumps on Silicon, 4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.
For SEM an independent analytical lab has tested this specimen in a FE-SEM and found that the pattern was very uniform and the specimen was easy to image. No significant charging was observed in the voltage range 1-20 kV. This traceable, Certified Standard is a select grade.
Electron Microscopy Sciences Omniprobe TEM Grid & Sample Holder, Stainless steel
This station is meant for 2 TEM grids and 1 sample Pin Stub. Long post – standard is 1/8" (3.2 mm) diameter x 0.32" (8.1 mm) length. Comes with an aluminum sample stub. Stainless Steel is very slightly magnetic.