Electron Microscope Accessories
Electron Microscopy Sciences Calibration Specimen 700-2D, Steel disk for AFM
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Array of Posts. Pitch 700 W-coated Photoresist on Si. Use TappingMode.
Mount: AFM
Electron Microscopy Sciences PS 100 XO Calibration Slide with UKAS
All of the PS-XO series of Calibration Slides are made with Green Float Glass and have a bright Chrome Image High definition 100mm scale in 0.1mm divisions with extended 0.5mm, 1.0mm and 5.0mm lines. Series of dots and crosses, at 10mm intervals.
Electron Microscopy Sciences Large Set Screw Vise, Ø25 mm, 3.2 mm x 8mm Pin
This set screw vice which is made from machined aluminum with stainless steel allen set screws has an open slot that is 10 mm (.394") wide x 5 mm (.197") deep. It measures 25 mm (1”) dia. x 17.5 mm (0.69”) high.
Type: 3.2 mm x 8 mm Pin
Electron Microscopy Sciences Calibration Specimen 150-1D, SEM Pin
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Has a nominal period (pitch) of 150 nm, one dimensional, fabricated on a transparent substrate (Aluminum lines on glass).
Mount: SEM Pin
Electron Microscopy Sciences Hitachi M4, Hitachi M4
Large double-slot set screw vise with (2) 2.5 mm x 5 mm deep slots. Clamp thin specimens and cross sections without conductive paint or tape. Dimensions: 25 x 10 mm (1 x 0.4"). Material: Machined aluminum with 2 stainless steel allen set screws. Includes allen wrench.
Type: Hitachi M4
Electron Microscopy Sciences Standard Pin SEM Stub Mini, 6.6 x 1.3 mm Head, 9.5 mm Pin, Aluminum
Mini SEM pin stub mount for Cambridge, Leica, ZEISS/LEO, FEI/Philips, CamScan, Tescan, ETEC and Amray. Made from lathe finished ultra-pure aluminum.
Head: 6.6 x 1.3 mm
Pin height: 3/8"
Electron Microscopy Sciences Standard Pin SEM Stub 3-Division 1/2" Head with 9 mm Pin, Aluminum, 3.2 mm Pin diameter
3-Division surface pin stub mounts are for use with FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan and Camscan are made from lathe finished ultra-pure aluminum.
Head: 1/2"
Pin height: 9 mm
Pin diameter: 3.2 mm
Electron Microscopy Sciences EMS Sedgewick-Rafter Counting Cell, Brass, 1.0 ml
Intended for use with standard or inverted compound microscopes at low magnifications. Both cells include two cover glasses and one plastic case. Slide is 1" x 3". Cell size is 1.96" W x 0.787" H x 0.04" DCell volume is 1.0 ml.
Electron Microscopy Sciences PS 100 XO Calibration Slide
All of the PS-XO series of Calibration Slides are made with Green Float Glass and have a bright Chrome Image High definition 100mm scale in 0.1mm divisions with extended 0.5mm, 1.0mm and 5.0mm lines. Series of dots and crosses, at 10mm intervals.
Electron Microscopy Sciences XX-Large Bulk Specimen Holder
Machined aluminum specimen holder for scanning electron microscopy holds up to 3" specimens. Opening is 80 mm wide x 48 mm long x 13 mm deep. Stainless steel allen set screws keep specimen in place. 3.2 mm pin. Allen wrench included.
Electron Microscopy Sciences Standard Pin SEM Stub Slotted 18 mm Head with 8 mm Pin, Aluminum, 3.2 mm Pin diameter
Pin stub mount with slotted head for use with Cambridge, Leica, ZEISS/LEO, FEI/Philips, PHENOM, CamScan, and Tescan.
Head: 18 mm
Pin height: 8 mm
Electron Microscopy Sciences Capsule Block Storage Box
For the storage of 15 capsule blocks in numbered cavities.
Electron Microscopy Sciences Standard Pin SEM Stub 9-Division 25 mm Head with 9 mm Pin, Aluminum, 3.2 mm Pin diameter
9 divisions surface min stub mounts are for use with FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan and Camscan SEMs. Mounts are made from lathe finished ultra-pure aluminum.
Head: 1"
Pin height: 9 mm
Pin diameter: 3.2 mm
Electron Microscopy Sciences Standard Pin SEM Stub 70° Low Profile, 1/2" Head with 3/8" Pin, Aluminum
70° low profile SEM specimen mount for use with FEI, Tescan, Zeiss, Philips, LEO, Cambridge, AMRAY, Leica, CamScan, ETEC. Made from ultra-pure aluminum.
Head: 1/2"
Pin height: 3/8"