Electron Microscope Specimen Mounts and Holders
Electron Microscopy Sciences SEM Cylinder Mount 45° Angle 5/8" Surface, Aluminum
Scanning electron microscope specimen mount with 45 degree angle. Made from lathe finished ultra-pure aluminum.
Head: 5/8"
Height: 3/8"
Electron Microscopy Sciences 45 degree Pin Stub Holder, 3.2 mm x 8mm Pin
This 45 degree pin stub holder allows for a higher SE signal without having to tilt the specimen stage and it accommodates any standard 12.7 mm (1/2") pin stubs with 3.2 mm (1/8") pin.. Grooved, machined aluminum with stainless steel Allen set screw.
Type: 3.2 mm x 8 mm Pin
Electron Microscopy Sciences Multi Holder for 8 Pin Stubs, 3.2 mm x 8mm Pin
This 50 mm in diameter multi pin holder is designed to save time.It is made from machined aluminum with stainless steel Allen wrench screws. It accommodates up to eight standard 12.7 mm (1/2") pin stubs.
Type: 3.2 mm
Electron Microscopy Sciences Multi Holder 45 ° for 6 pin stubs, 3.2 mm x 8mm Pin
This 35 mm in diameter 45 Degree multi pin holder is designed to save time. It allows for a higher SE signal without having to tilt the specimen. It is made from machined aluminum with stainless steel Allen set screws. It accommodates up to six standard 12.7 mm (1/2") pin stubs.
Type: 3.2 mm x 8 mm Pin
Electron Microscopy Sciences Variable Size Geological Thin Section Holder, 9.5mm Pin
This thin section holder is made from vacuum grade aluminum with copper clips and brass screws . The unit measures 51x32x8 mm and holds either standard thin sections of 47 x 27 mm or smaller or larger thin sections. Smallest size would be 40x20 mm. The holder comes complete with 2 clips to insure nothing moves. The holder has convenient tweezer inserts which allow for easy loading.
Type: 9.5mm Pin
Electron Microscopy Sciences Geological Thin Section Holder 9.5 mm
This thin section holder is made from aluminum with copper clips and brass screws. The unit measures 55x30x8 mm and holds a standard geological thin section or slide measuring 47 x 27 mm. The holder comes complete with 2 clips to insure nothing moves. The holder has convenient tweezer inserts which allow for easy loading.
Electron Microscopy Sciences Calibration Specimen 150-1D, Choose a mount
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Has a nominal period (pitch) of 150 nm, one dimensional, fabricated on a transparent substrate (Aluminum lines on glass).
Mount: Choose a mount
Electron Microscopy Sciences Calibration Specimen 700-2D, Steel disk for AFM
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Array of Posts. Pitch 700 W-coated Photoresist on Si. Use TappingMode.
Mount: AFM
Electron Microscopy Sciences Calibration Specimen 150-1D, SEM Pin
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Has a nominal period (pitch) of 150 nm, one dimensional, fabricated on a transparent substrate (Aluminum lines on glass).
Mount: SEM Pin
Electron Microscopy Sciences PS 300 XO Calibration Slide with UKAS
All of the PS-XO series of Calibration Slides are made with Green Float Glass and have a bright Chrome Image High definition 300mm scale in 0.1mm divisions with extended 0.5mm, 1.0mm and 5.0mm lines. Series of dots and crosses, at 10mm intervals.
Electron Microscopy Sciences Hitachi M4 SEM Cylinder Mount 5/8" surface, 3/8" height, Aluminum
Hitachi M4 Thread SEM mounts made from lathe finished ultra-pure aluminum.
Head: 5/8"
Height: 3/8"
Electron Microscopy Sciences SEM Cylinder Mount 45° Angle 5/8" Surface, Aluminum
Scanning electron microscope specimen mount with 45 degree angle. Made from lathe finished ultra-pure aluminum.
Head: 5/8"
Height: 3/8"
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1-1/4" surface, 3/16" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1-1/4"
Height: 3/16"
Electron Microscopy Sciences Variable Tilt Mount, Hitachi M4
This mount which is made from aluminum is used for the mounting and tilting of samples from 0 – 90 degrees as well as for SEM investigation with small working distances. The mount is marked for 30, 45, 70 and 90 degress. The table measures 11 x 11 mm (0.46" x0.46")and the overall size is 14 x 14 x12.7 mm
Type: Hitachi M4
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1-1/4" surface, 3/16" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1-1/4"
Height: 3/16"