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Electron microscopes are instruments that use a beam of electrons to provide a high resolution image. Techniques include scanning, transmission and focused ion beam electron microscopy, and X-ray microtomography. Available in desktop size.
Double-slot set screw vise with (2) 1 mm wide x 3 mm deep slots. Clamp thin specimens or cross sections. Effectively holds wafers and thin samples up to 1 mm (.039") thick. The dimensions are 15 mm dia x 6 mm H. Made of aluminum with 2 stainless steel allen set screws. Includes allen wrench. Type: Hitachi M4
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Low Profile SEM stub specimen mount with shorter pin (6 mm) and 45° & 90° mounting surfaces for use with Zeiss/LEO scanning electron microscopes, FE-SEMs & FIB systems. Made from ultra-pure aluminum with a standard lathe finish. Head: 1/2" Pin height: 3/8"
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The HUOT Toolholder Vise For BT50 Taper 16T927 is a toolholder vise designed for BT50 taper toolholders. It has a clamping range of 0.39" to 1.57" and can hold tool shanks up to 1.57" in diameter. The vise body is made of ductile iron with a black oxide finish. It comes with an M10 mounting stud and nut. The vise can withstand up to 20,000 PSI hydraulic clamping force. This is a high quality toolholder vise for secure holding of BT style toolholders in milling machines.
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Large double-slot set screw vise with (2) 2.5 mm x 5 mm deep slots. Clamp thin specimens and cross sections without conductive paint or tape. Dimensions: 25 x 10 mm (1 x 0.4"). Material: Machined aluminum with 2 stainless steel allen set screws. Includes allen wrench. Type: Hitachi M4
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Mini SEM pin stub mount for Cambridge, Leica, ZEISS/LEO, FEI/Philips, CamScan, Tescan, ETEC and Amray. Made from lathe finished ultra-pure aluminum. Head: 6.6 x 1.3 mm Pin height: 3/8"
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Intended for use with standard or inverted compound microscopes at low magnifications. Both cells include two cover glasses and one plastic case. Slide is 1" x 3". Cell size is 1.96" W x 0.787" H x 0.04" DCell volume is 1.0 ml.
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All of the PS-XO series of Calibration Slides are made with Green Float Glass and have a bright Chrome Image High definition 100mm scale in 0.1mm divisions with extended 0.5mm, 1.0mm and 5.0mm lines. Series of dots and crosses, at 10mm intervals.
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Machined aluminum specimen holder for scanning electron microscopy holds up to 3" specimens. Opening is 80 mm wide x 48 mm long x 13 mm deep. Stainless steel allen set screws keep specimen in place. 3.2 mm pin. Allen wrench included.
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9 divisions surface min stub mounts are for use with FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan and Camscan SEMs. Mounts are made from lathe finished ultra-pure aluminum. Head: 1" Pin height: 9 mm Pin diameter: 3.2 mm
Encompass Procurement Services Non-distribution item offered as a customer accommodation; additional freight charges may apply. Learn More
70° low profile SEM specimen mount for use with FEI, Tescan, Zeiss, Philips, LEO, Cambridge, AMRAY, Leica, CamScan, ETEC. Made from ultra-pure aluminum. Head: 1/2" Pin height: 3/8"
Encompass Procurement Services Non-distribution item offered as a customer accommodation; additional freight charges may apply. Learn More