Microscope Lamps and Accessories
Electron Microscopy Sciences Single Line Graticle NE50, 16mm, 0.02 mm Line width
For measurement of large objects and alignment in conjunction with a graduated mechanical stage. Single line, nominal width 0.02 mm, image covers entire field of view, surface chrome image.
Size: 16mm
Line width: 0.02 mm
Surface: Chrome image
Electron Microscopy Sciences Veco Square Mesh Handle 150 mesh Copper Grid
Veco Grids offer superior handling characteristics. Plus, with a 0.8 mil thickness, Veco Grids are the most rigid grids available. 3.05 mm diameter.
Grid: Copper
Pitch: 167 µm
Hole: 117 µm
Bar: 50 µm
Electron Microscopy Sciences SEM Ultra High Resolution Gold on Carbon Test Specimen, JEOL Stub
With gold particles ranging from <1 nm to 20 nm, this test is suitable for ultra high resolution SEM tests such as field emission electron source. A magnification of at least 80,000x is required for this test.
Mount: JEOL Stub
Electron Microscopy Sciences Shorter Pin SEM Stub Slotted 18 mm Head with 6 mm Pin, Aluminum, 3.2 mm Pin diameter
SEM specimen mount with shorter pin and slotted head for use with all Zeiss/LEO SEM, FESEM & FIB systems. Made from ultra-pure aluminum with a standard lathe finish.
Head: 18 mm
Pin height: 6 mm
Pin diameter: 3.2 mm
Electron Microscopy Sciences Standard Pin SEM Stub 3-Division 18 mm Head with 9 mm Pin, Aluminum, 3.2 mm Pin diameter
Pin stub mount with 3 divisions for use with FEI, Phillips, LEO, Zeiss, Cambridge, Leica, Amray, Tescan and Camscan SEMs. Made from ultra-pure aluminum with a standard lathe finish.
Head: 18 mm
Pin height: 9 mm
Pin diameter: 3.2 mm
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1" surface, 3/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1"
Height: 3/8"
Electron Microscopy Sciences Gilder Parallel Bar Grid G200PB, Nickel
Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected.
Material: Nickel
Pitch: 125 µm
Hole: 80 µm
Bar: 45 µm
Electron Microscopy Sciences Gilder Parallel Bar Grid G200P, Nickel
Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected.
Material: Nickel
Pitch: 125 µm
Hole: 80 µm
Bar: 45 µm
Electron Microscopy Sciences Embra Finder 400 mesh Grid, Nickel
Standard 3.05 mm diameter grids which have one straight and one round cut out from the rim which assists in the orientation of the grid.
Grid: Nickel
Electron Microscopy Sciences Veco Hexagonal 400 mesh Copper Grid
Veco Grids offer superior handling characteristics. Plus, with a 0.8 mil thickness, Veco Grids are the most rigid grids available. 3.05 mm diameter, 0.8 mil thickness.
Grid: Copper
Pitch: 63 µm
Hole: 30 µm
Bar: 33 µm
Electron Microscopy Sciences Veco Square Center Reference 200 mesh Nickel Grid
Veco Grids offer superior handling characteristics. Plus, with a 0.8 mil thickness, Veco Grids are the most rigid grids available. 3.05 mm diameter.
Grid: Nickel
Pitch: 50%
Electron Microscopy Sciences Veco Hexagonal 100 mesh Copper Grid
Veco Grids offer superior handling characteristics. Plus, with a 0.8 mil thickness, Veco Grids are the most rigid grids available. 3.05 mm diameter, 0.8 mil thickness.
Grid: Copper
Pitch: 250 µm
Hole: 200 µm
Bar: 50 µm
Electron Microscopy Sciences Metallurgical Graticle G54, 19mm, ASTM 24
Standard pattern discs for metallurgical stereometric analysis of grain size in polished metal sections. ASTM 24 point circular grid, glass sandwich.
Size: 19mm
Method: ASTM 24
Surface: Glass sandwich
Electron Microscopy Sciences Gilder Parallel Bar Grid G400P, Copper
Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected.
Material: Copper
Pitch: 62 µm
Hole: 22 µm
Bar: 40 µm